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The
conference has six major themes, and the following areas are of particular
interest:
MATERIALS
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Advances in materials growth technologies
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Atomically structured materials
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Semiconductors, magnetic semiconductors, organics, polymers, carbon
nanotubes, superconductors, metals, insulators, hybrid structures, and other
materials
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Photonic crystals
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Quantum wells, wires and dots
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Patterned and selective area growth
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In-situ processing and characterisation
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Production and manufacturability issues of epitaxial growth techniques
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PHYSICS
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Characterisation of low
dimensional structures: scanning probe
microscopy and electron spectroscopy
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Basic science and concepts of
surfaces
and interfaces
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Low dimensionality and nanostructures
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New device-related phenomena
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Heterostructures and superlattices: optical and transport
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Two, one and zero dimensional systems
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Spin
related phenomena in low dimensional structures
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DEVICES
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Optoelectronic devices and applications
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Integrated optoelectronic devices
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Electronic devices and applications
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Nanoelectronics
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Magnetoelectronics – Spintronics
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High power, high temperature devices
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Nanodevices and molecular electronics
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High-speed
devices technologies for future wireless,
automotive
and microwave applications
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New materials and new concepts
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DEVICE TECHNOLOGY
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Device technology
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Process integration
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Lithography for semiconductor manufacturing
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Nanolithography
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Advances in processing technologies
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Device
passivation, encapsulation and packaging
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Low dimensional device architecture
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MICROSYSTEMSTECHNOLOGY,
PRODUCTION AND MANUFACTURABILITY
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Micromachining and microfabrication process technology
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Micromachined devices and components
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Microelectronic structures and
microcavities
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Material issues
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Device and system modelling
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Manufacturing issues
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SYSTEMS INTEGRATION OF LOW DIMENSIONAL STRUCTURES AND DEVICES
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MEMS,
NMES and MOEMS fabrication
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Integration technologies:
modular and multifunctional systems
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Assembly technologies
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Microconnect
issues
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Thermal
issues
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System modelling: safety, reliability and
intelligence
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Manufacturing
issues
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Metrology for microsystems
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New
concepts and perspectives
Conference
Scope | Conference
Topics | Conference
Committees | Venue
& Accommodation |
Invited Speakers |
Important
Dates | Abstract
Submission | Proceedings
|
Oral
Presentation |
Poster Presentation |
Social
Events | Registration Information |
LDSD 2002 Photographs |
Conference
Secretariat
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